The MCS Series is a line of high-performance spectrometers developed by ZEISS, designed to deliver exceptional spectral analysis across a broad range of applications. These spectrometers are engineered to provide high resolution and sensitivity, making them ideal for precise measurements in various scientific and industrial fields.
Key Features:
Broad Spectral Range: The MCS Series operates over a spectral range from 190 nm to 1015 nm, encompassing ultraviolet (UV), visible (VIS), and near-infrared (NIR) wavelengths. This extensive range allows for comprehensive analysis of diverse materials and processes.
High Resolution: With a full width at half maximum (FWHM) resolution of less than 3 nm, the MCS Series ensures precise spectral measurements, enabling detailed analysis of complex spectra.
Superior Signal-to-Noise Ratio (SNR): The spectrometers are designed to provide exceptional SNR, facilitating accurate detection of weak signals and enhancing measurement reliability.
Flexible Detector Options: The MCS Series offers various detector configurations, including CCD and photodiode arrays, to meet specific application requirements. These options provide flexibility in balancing sensitivity and speed.
Robust Design: Constructed with durable materials and designed for stability, the MCS Series is suitable for demanding environments, ensuring consistent performance over time.
Applications:
Semiconductor Process Control: Employed in thin film thickness measurements, optical emission spectroscopy (OES), and spectral ellipsometry/reflectometry to monitor and control semiconductor manufacturing processes.
Environmental Monitoring: Used for analyzing atmospheric components and pollutants, aiding in environmental research and regulatory compliance.
Material Characterization: Assists in the analysis of material properties, including optical characteristics and composition, essential for quality control and development.
Pharmaceutical and Food Quality Control: Facilitates the assessment of product quality and safety through precise spectral analysis.
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